Gaya APA

KAUFMAN, A, S., Oakes, J. (1994). Intelligent testing with the WISC-III/Alan S. Kaufman . New York: John Wiley \r Sons.

Gaya MLA

KAUFMAN, Alan, S.., Oakes, Jeannie. "Intelligent testing with the WISC-III/Alan S. Kaufman". New York: John Wiley \r Sons, 1994. Text.